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Scanning Electron Microscope with Energy Dispersive Spectrometer (SEM/EDS)
The SEM images the surface structure of bulk samples, from the biological, medical, materials sciences and earth sciences up to magnifications of approximately 20,000X. The images have a greater depth of field and resolution than optical micrographs making it ideal for rough specimens such as fracture surfaces and particulate materials. Images can be recorded either digitally or photographically. EDS allows elemental analysis with the SEM. Qualitative analyses of the elements Sodium through Uranium down to levels of 0.1% for some elements.
X-Ray Diffraction (XRD) is a versatile analytical technique used in research, production and quality control environments to analyze crystalline materials. XRD is used for the identification of minerals in sample powders with applications throughout earth sciences. Common applications include the identification of boiler scales, mineral deposits, sludge and powders.
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